Alemnis公司的NanoIndenter納米壓痕儀是一款結(jié)構(gòu)緊湊，功能多樣的儀器，可與眾多測(cè)試和成像設(shè)備集成，并可用于多種不同的應(yīng)用場(chǎng)景。適用于掃描電子顯微鏡（SEM）的原位測(cè)量，也可用于同步輻射裝置和光學(xué)顯微鏡的常規(guī)環(huán)境中使用。

這款原位納米壓痕儀是可以真正提供形變控制模式的儀器，可為許多材料測(cè)試和各種應(yīng)用領(lǐng)域提供的靈活性、準(zhǔn)確性和真正的原位納米機(jī)械性能測(cè)試。

Alemnis的納米壓痕儀可經(jīng)過改裝，升級(jí)模塊后，可在高剪切應(yīng)變下進(jìn)行動(dòng)態(tài)機(jī)械性能測(cè)試，并可在超高溫條件下進(jìn)行測(cè)試。

The Idea of Nanoindentation
In Nanoindentation, a sample is indented with a small diamond tip (tip radius some nm).
In situ Nanoindentation can give more information on the formation and propagation of mechanically induced dislocations and defects during the experiment.
The In Situ Nanoindenters are compact, robust, versatile and can be fitted to various kinds of microscopes such as Scanning Electron Microscopes (SEM), light microscopes, Synchrotron beamlines, and many more. The idea of nanoindentation arose from the realization that an indentation test is an excellent way to measure very small volumes of materials.

Experimental Aspects
? Successfully address metrology challenges like Mechanical Strength (Elastic Modulus, Hardness, Fracture), Interfacial Adhesion and Failure
? Characterization of microstructural changes with sub-nanometer resolution in an in-situ vacuum environment
? Characterizing the mechanical properties of surfaces or structures IN-SEM and IN-AIR
? Characterization of organic, inorganic, soft or hard materials and coatings
? Nanomechanical characterization with direct observation

Understanding material behavior at the micro-ａnd nano-scale

? Compact and robust design in a stand-alone instrument that is easy to install and remove and which can operate in any position(horizontal, vertical or tilted).

System Specifications 
? Primary indentation mode: True displacement
? Customizable software
? Standalone instrument, operating in SEM or in ambient
? Maximum indentation load: 0.5 N (standard) and 2.5 N (optional)
? Indentation load RMS noise: 4 μN(yùn)* (0.5 N range) and 20 μN(yùn)* (2.5 N range)
? Maximum indentation depth: 40 μm
? Indentation depth RMS noise: 1 nm*
? XY closed loop sample micro-positioning system with 26 mm range
? Z closed loop indenter tip micro-positioning system with 22 mm range
? XYZ micro-positioning system resolution: 1.2 nm
? Maximum recommended test area: 10 x 10 mm
? Heating/Cooling Options: -120°C up to 1000°C
? Strain Rate Options: controlled strain rate up to 10’000 s-1
? Weight: ~ 500 g