中茂Chroma 19052 19053 19054 中茂Chroma 19052 19053 19054
深圳市現(xiàn)代豪方儀器儀表科技有限公司
： 陳工
工作: 1950742972
：
地址：深圳市南山區(qū)科技園南海大道4050號(hào)
Model 19050 series 耐壓測(cè)試器
主要特色：
交/直流耐壓、絕緣電阻測(cè)試三合一機(jī)型
可程序輸出電壓AC 5kV，DC 6kV
可程序電流zui大AC 30mA，DC 10mA
絕緣阻抗 50GΩ/1000V DC
內(nèi)建 8 組高壓掃描儀 (19053)
內(nèi)建 4 組高壓掃描儀 (19054)
開/短路偵測(cè)功能(OSC)
人體保護(hù)功能 (GFI)
電氣閃絡(luò)偵測(cè)功能 (Flashover)
可組合 50 個(gè)測(cè)試步驟及 100 組記憶功能
具 0.4 ms快速切斷及 0.2 sec 快速放電
可選購(gòu)變壓器測(cè)試治具 (19053)
標(biāo)準(zhǔn) RS-232 接口
可選購(gòu) GPIB 界面
耐壓測(cè)試器Chroma 19050系列有三個(gè)機(jī)種供選擇，19052 AC/DC/IR耐壓測(cè)試器，19053 AC/DC/ IR耐壓測(cè)試器，內(nèi)建8組高壓掃描功能，19054 AC/DC/IR耐壓測(cè)試器，內(nèi)建4組高壓掃描功能。數(shù)字顯示面板，容易操作的接口便于變壓器產(chǎn)品執(zhí)行耐壓、絕緣測(cè)試，為型耐壓測(cè)試器。
Model Description
19052 耐壓測(cè)試器 (AC/DC/IR)
19053 耐壓測(cè)試器(AC/DC/IR/8CH SCAN)
19054 耐壓測(cè)試器 (AC/DC/IR/4CH SCAN)
Model 19052/19053/19054 Hipot Tester
Key Features：
3 in 1 Tester : AC, DC, IR
Programmable output voltage to 5kV AC and 6kV DC
Trip current programmable to 30mA AC and 10mA DC
Insulation resistance to 50GΩ/1000V DC
Built-in 8 channel SCANNER (19053 only)
Built-in 4 channel SCANNER (19054 only)
Open/Short Check (OSC)
Ground Fault Interrupt (GFI)
ARC detection (Flashover)
Storage of 50 Tests Setups with 100 Steps per setup
Optional transformer test fixture (19053 only)
Standard RS-232 Interface
Optional GPIB Interface
The Chroma Hipot Tester 19050 series provide 3 models for choice. The 19052 for AC/DC/IR Hipot testing and insulation resistance (IR) measurements, the 19053 which combines both AC and DC Hipot tests and IR measurements with 8HV scan channel capability into a single compact unit, and the 19054 which combines both AC and DC Hipot tests and IR measurements with 4HV scan channel capability into a single compact unit. The front panels of the fevers make them easy to operate. Digital display and user friendly control allows test parameters and limits to be set easily without the high voltage activating.
Model Description
19052 Hipot Test (AC/DC/IR)
19053 Hipot Test (AC/DC/IR/8CH SCAN)
19054 Hipot Teste (AC/DC/IR/4CH SCAN)
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